Материалов:
875 618

Репозиториев:
30

Авторов:
596 024

По вашему запросу найдено документов: 377

Страница 1 из 38

RBS-channeling analysis of er D-doped LNP(001) crystal was carried out by Rutherford backscattering spectromery with the channeling technique

Analytical technologies for thin coating element material diagnostics with PXWR application element composition in the bulk and thin surface layer of studied objects. Rutherford backscattering

RBS-channeling analysis of er D-doped LNP(001) crystal was carried out by Rutherford backscattering spectromery with the channeling technique

RBS-channeling analysis of er D-doped LNP(001) crystal was carried out by Rutherford backscattering spectromery with the channeling technique

Self-Ion Assisted Modification of Elastomer and Its Micro- and Macroscopic PropertiesThe composition of Zr-based thin films on rubber was investigated by utilizing the Rutherford

On double polarization asymmetries in the elastic electron-proton scatteringRutherford backscattering spectroscopy

Comparison of radiation damage and mechanical and tribological properties of α-Fe exposed to intense pulsed electron and ion beamsRutherford backscattering spectroscopy

Defects in α-Fe induced by intense-pulsed ion beam (IPIB)Using Rutherford back-scattering (RBS), secondary ion mass spectrometry (SIMS), Auger

Silicon hyperdoped with selenium for broad band infrared photodetectors and solar cells was investigated by Rutherford backscattering. The crystallinity of the doped silicon layer and the fraction of Se

Composition and Microstructure of Surface Layers Produced by Ion Beam Assisted Deposition of Metals from a Pulsed Arc-Discharge Plasma onto Aluminum Substrates stability was carried out.. The Rutherford backscat.t.ering spectrometry, electron backscat.t.er

Страница 1 из 38