GaAs:Cr X-ray sensors noise characteristics investigation by means of amplitude spectrum analysis
Chsherbakov, I.,
Lozinskaya, A. D.,
Mihaylov, T.,
Novikov, V.,
Shemeryankina, A.,
Tolbanov, Oleg P.,
Tyazhev, Anton V.,
Zarubin, A. N.,
Kolesnikova, I.
Связанные документы (рекомендация CORE)