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Visualization of G-Quadruplexes, i-Motifs and Their Associates
Dubrovin E.V., Barinov N.A., Klinov D.V.
: fluorescence microscopy, transmission electron microscopy (TEM), and atomic force microscopy (AFM). The key
Ceramic technology. How to investigate surface finishing
Ionescu C., Hoeck V.
analytical methods, such as macroscopy, optical microscopy, electron microprobe, scanning electron microscopy
The unique hybrid precipitate in a peak-aged Al-Cu-Mg-Ag alloy
Gazizov, M. R., Boev, A. O., Marioara, C. D., Andersen, S. J., Kaibyshev, R. O.
has been investigated using transmission electron microscopy methods. The precipitate atomic structure
Effect of Heating Temperature and Modification of Al-27% Cu-6% Si Melt on the Structure and Phase Composition of Crystallized Specimens
Nikitin, K. V., Chikova, O. A., Timoshkin, I. Yu., Konstantinov, A. N.
Therma scanning probe microscope at 150 and 300A degrees C.
Визуализация G-квадруплексов, i-мотивов и их ассоциатов
Дубровин Е.В., Баринов Н.А., Клинов Д.В.
: fluorescence microscopy, transmission electron microscopy (TEM), and atomic force microscopy (AFM). The key
Features of formation of Yersinia enterocolitica biofilms
Lenchenko E., Lozovoy D., Strizhakov A., Vatnikov Y., Byakhova V., Kulikov E., Sturov N., Kuznetsov V., Avdotin V., Grishin V.
Selective Agar medium (“CIN-agar”) at 28°C for 24 h. The microorganisms were grown in meat-peptone broth
Edge interfaces of the Ω plates in a peak-aged Al-Cu-Mg-Ag alloy
Gazizov, M. R., Boev, A. O., Marioara, C. D., Holmestad, R., Kaibyshev, R. O.
in a peak-aged Al-Cu-Mg-Ag alloy by atomic-resolution scanning transmission electron microscopy (STEM
Hydrothermal synthesis of α-Zn2SiO4:V phosphor, determination of oxidation states and structural localization of vanadium ions
Samigullina R., Tyutyunnik А., Gracheva I., Krasnenko Т., Zaitseva N., Onufrieva T.
C. Electron microscopy
Study of the Thermal Stability of Copper Contact Junctions in Si/SiO2 Substrates
Vorobjova, A. I., Labunov, V. A., Outkina, E. A., Khodin, A. A., Sycheva, O. A., Ezovitova, T. I.
of TiN in Si/SiO2 substrates by scanning electron microscopy (SEM) and differential thermal
Degradation of electroplated silver coatings under the influence of an electric arc
Karwat, C., Kolasik, M., Kozar, C., Zukowski, P., Luhin, V. G., Zharsky, I. M.
for the cut-off current intensity. A method of scanning electron microscopy together with an x

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