Circuit checking based on their metric properties is constructed on the basis of the metric properties of the relevant class of
circuits. The proposed technique
An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy with emphasis on OBIST strategy for analog integrated
circuits. The design procedures according to DFT flow
Automated simulation of faults in analog circuits based on parallel paradigm make strong or weak influence on a correct
circuit behavior. Therefore it is necessary to estimate
Circuit checking based on their metric properties is constructed on the basis of the metric properties of the relevant class of
circuits. The proposed technique
Detection and masking of trojan circuits in sequential logicMatrosova, Anjela Yu.,
Ostanin, Sergey A.,
Butorina, Nataly Borisovna,
Pahomova, Elena Grigorievna,
Shulga, Sergey Anatolievich,
Mitrofanov, Evgenii V. Inserting malicious sub-
circuits that may destroy a logical
circuit or provide leakage