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Study of characteristics of electrostatic interaction between RNases and mica surface using atomic force microscopy
Konovalova O., Kalacheva N., Shirshikov F., Salakhov M.
charged mica surface was investigated using atomic force microscopy. An analysis of the kinetics of RNase
Surface profile gradient in amorphous Ta2O5 semi conductive layers regulates nanoscale electric current stability
Cefalas A., Kollia Z., Spyropoulos-Antonakakis N., Gavriil V., Christofilos D., Kourouklis G., Semashko V., Pavlov V., Sarantopoulou E.
of amorphous layers is established by means of atomic, conductive, electrostatic force and thermal scanning
Surface profile gradient in amorphous Ta2O5 semi conductive layers regulates nanoscale electric current stability
Cefalas A., Kollia Z., Spyropoulos-Antonakakis N., Gavriil V., Christofilos D., Kourouklis G., Semashko V., Pavlov V., Sarantopoulou E.
of amorphous layers is established by means of atomic, conductive, electrostatic force and thermal scanning
Preparation and Chemical/Physical Characterization of Individual Na-noscaled Fibrils
Senthilkumar P., Chandran S., Kartsev A., Shavrov V., Lega P., Subramani R.
to characterize the chemical and physical properties of single nanofibrils including atomic force microscopy
Study of characteristics of electrostatic interaction between RNases and mica surface using atomic force microscopy
Konovalova O., Kalacheva N., Shirshikov F., Salakhov M.
charged mica surface was investigated using atomic force microscopy. An analysis of the kinetics of RNase
Surface profile gradient in amorphous Ta2O5 semi conductive layers regulates nanoscale electric current stability
Cefalas A., Kollia Z., Spyropoulos-Antonakakis N., Gavriil V., Christofilos D., Kourouklis G., Semashko V., Pavlov V., Sarantopoulou E.
of amorphous layers is established by means of atomic, conductive, electrostatic force and thermal scanning
Surface profile gradient in amorphous Ta2O5 semi conductive layers regulates nanoscale electric current stability
Cefalas A., Kollia Z., Spyropoulos-Antonakakis N., Gavriil V., Christofilos D., Kourouklis G., Semashko V., Pavlov V., Sarantopoulou E.
of amorphous layers is established by means of atomic, conductive, electrostatic force and thermal scanning
Enhancement of interfacial adhesion in bitumen coatings by film-forming agents
Kemalov A., Kemalov R.
or electrostatic) forces rather than as a result of chemical reactions. Comparison of the solubility parameters
Changes in K-208Sr Thermal Control Coating Features after Electron and Proton Irradiation with Energy of 20 keV
Khasanshin R.H., Kostyuk V.I., Tokar S.V., Kosogorov A.V., Primenko D.A., Shishov K.A.
in morphology of irradiated samples were by atomic force microscopy investigated, and changes in their spectral
The effect of cell pretreatment on cell surface topology studied via atomic force microscopy
Konovalova O., Steryakov O., Konovalova T., Anchikova L., Valeeva I.
Atomic force microscopy allows distinctively interpret the results of cell structure research

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