Kinetic parameters and activation criteria of the oxidative mechanical degradation of coalsThe kinetic
parameters of the oxidative mechanical
degradation of various coals on treatment
Models describing the degradation of functional parameters of electronic devices based on the Weibull-Gnedenko distributionBorovikov, S. M.,
Shneiderov, E. N.,
Burak, I. A.,
Боровиков, С. М.,
Шнейдеров, Е. Н.,
Бурак, И. А. The authors offer the possibility for obtaining the mathematical model of
degradation of a
Models describing the degradation of functional parameters of electronic devices based on the Weibull–Gnedenko distributionBorovikov, S. M.,
Shneiderov, E. N.,
Burak, I. A.,
Боровиков, С. М.,
Шнейдеров, Е. Н.,
Бурак, И. А. The authors offer the possibility for obtaining the mathematical model of
degradation of a
Application of splitting to failure estimation in controllable degradation systemWe consider a regenerative
degradation process composed by a sum of the successive phases, where
ILLUMINATION-INDUCED DEGRADATION OF A-SI:H SOLAR CELL PARAMETERS.e. the degree of
degradation of a-Si:H pinpin solar cell
parameters was studied on different i-layer thickness
Экспериментальное исследование деградации изделий электронной техникиБоровиков, С. М.,
Шнейдеров, Е. Н.,
Плебанович, В. И.,
Бересневич, А. И.,
Бурак, И. А.,
Borovikov, S. M.,
Shneiderov, E. N.,
Plebanovich, V. I.,
Berasnevich, A. I.,
Burak, I. A. the
degradation of the
functional
parameters of three types of high-power transistors
Testing significance of random effects for the gamma degradation modelGamma
degradation models with fixed or random effects are widely used for reliability analysis
Эффективность моделей деградации функциональных параметров при прогнозировании параметрической надежности полупроводниковых приборовБоровиков, С. М.,
Цырельчук, Н. И.,
Дик, С. С.,
Шнейдеров, Е. Н.,
Borovikov, S. M.,
Tsyrelchuk, N. I.,
Dzik, S. S.,
Shneiderov, E. N. .
For semiconductor devices of high power, the authors experimentally obtained of models
of functional
degradation