Characterization of an UO2 ceramic via Raman imaging and electron back-scattering diffractionIltis, Xavière,
Desgranges, Lionel,
Ammar, Mohamed Ramzi,
Genevois, Cécile,
Bilbao, Emmanuel de,
Canizarès, Aurélien,
Barannikova, Svetlana A.,
Leontyev, Igor N.,
Simon, Patrick,
Maslova, Olga A. Raman image,
electron back-scattering diffraction (EBSD) measurements are carried out. EBSD data allow a
EBSD study of superplastically strained Al-Mg-Li alloyIn this study,
electron back scatter diffraction (EBSD) was employed to examine the microstructure
Influence of real photon diffraction contribution on parametric X-ray observed characteristicsIt is proposed and implemented a simple method of calculating of the output of the
diffracted real
Relative contribution of real and virtual photon diffraction to the parametric X-ray yield relativistic
electrons penetrating a crystal under Bragg
scattering condition is studied theoretically