Models describing the degradation of functional parameters of electronic devices based on the Weibull-Gnedenko distributionBorovikov, S. M.,
Shneiderov, E. N.,
Burak, I. A.,
Боровиков, С. М.,
Шнейдеров, Е. Н.,
Бурак, И. А. period on the basis of the 3-parametric Weibull-Gnedenko distribution. This model provides
reliability Parameters selection for information storage reliability assessment and prediction by absolute values of choosing parameters for estimating and
predicting the
reliability of an information storage device
Selection of the Method to Predict Vehicle Operation Reliability system for
predicting the vehicle engine operational
reliability. The results of the study show
Models describing the degradation of functional parameters of electronic devices based on the Weibull–Gnedenko distributionBorovikov, S. M.,
Shneiderov, E. N.,
Burak, I. A.,
Боровиков, С. М.,
Шнейдеров, Е. Н.,
Бурак, И. А. period on the basis of the 3-parametric Weibull–Gnedenko distribution. This model provides
reliability Reliability Prediction of Electroniс Devices, Considering the Gradual FailuresThe authors suggest a method of the
reliability prediction for electronic devices, considering