Electrical characterization of insulator-semiconductor systems based on graded band gap MBE HgCdTe with atomic layer deposited Al2O3 films for infrared detector passivation
Voytsekhovskiy, Alexander V.,
Nesmelov, Sergey N.,
Dzyadukh, Stanislav M.,
Varavin, Vasilii S.,
Dvoretsky, Sergei A.,
Mikhailov, Nikolay N.,
Yakushev, Maxim V.,
Sidorov, Georgiy Yu.
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