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Broad-band spectra of Cygnus X-1 and correlations between spectral characteristics
Ibragimov A., Poutanen J., Gilfanov M., Zdziarski A., Shrader C.
1 MeV. We study correlations between parameters obtained from the spectral fits with different
Correlation between Color of Subsurface Soil Horizonsand Ground-Penetrating Radar Data
Воронин А.Я., Савин И.Ю.
in parameters of the spectral Fourier transform of electromagnetic pulses in subsurface medium of chernozems
МАТЕМАТИЧЕСКОЕ МОДЕЛИРОВАНИЕ РАСПРЕДЕЛЕНИЯ БОЛЬЦМАНА В ПРОЦЕССЕ ПОЛУЧЕНИЯ НИЗКОТЕМПЕРАТУРНОЙ ПЛАЗМЫ
Белый В.С., Зайцева Т.Н., Туранова А.В.
levels of the electrons of the carbon atom on their energy parameters.
Regularities in the Stark widths of spectral lines of ns - n′p and np - n′s transitions for a series of neutral atoms
Sarandaev E., Konovalova O., Salakhov M.
Dependencies enabling one to estimate the Stark widths of spectral lines due to s-p and p
Particle swarm optimization in the problem of decomposing two-component spectral profiles
Galimullin D., Sibgatullin M., Kamalova D., Salakhov M.
of complex model spectra and determination of the parameters of spectral components. © 2014 Allerton Press
New approach of decomposition of complex spectral contours based on particles swarm optimization
Galimullin D., Sibgatullin M., Kamalova D., Salakhov M.
that the method supposed allows one to separate complex model spectra and to determine parameters of spectral
The influence of the nuclear self energy function on the spectral lines of atoms with unstable nuclei
Gainutdinov R., Mutygullina A., Petrova A.
of the unstable nucleus is constructed. A new arbitrary parameter characterizing the nuclear interaction
Physical parameters and dynamical properties of the multiple star o and
Zhuchkov R., Malogolovets E., Kiyaeva O., Orlov V., Bikmaev I., Balega Y., Safina D.
are used to refine the orbital parameters of the subsystems. The spectral types, absolute magnitudes
Synthesis, structure, and spectral fluorescence properties of 1,4-di(5-phenyl-2-oxazolyl)benzene heteroanalogs
Obukhov A.E., Afanasiadi L.Sh., Patsenker L.D., Shershukov V.M.
structure and their principal spectral fluorescence parameters have been calculated using the PPP method
Spectral Ellipsometry as a Method of Investigation of Influence of Rapid Thermal Processing of Silicon Wafers on their Optical Characteristics
Solodukha, V. A., Pilipenko, U. A., Omelchenko, A. A., Shestovski, D. V.
and reticular density on their optical characteristics by means of the spectral ellipsometry method

Страница 9 из 2672

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