MOKE investigation of silicide films ion-beam synthesized in single-crystal silicon implanted with 40 keV Fe + ions with
a fluence of 3 × 10 17 cm -2 in the external magnetic field of 9.6 × 10
Change in the sign of the Kerr effect in ion-beam-synthesized Fe3Si films-magnetic resonance, electron diffraction, and Auger spectroscopy.
A change in the direction of rotation of the plane
MOKE investigation of silicide films ion-beam synthesized in single-crystal silicon implanted with 40 keV Fe + ions with
a fluence of 3 × 10 17 cm -2 in the external magnetic field of 9.6 × 10
Effect of irradiation by argon ions on hydrogen transport through the surface oxide layer of zirconium not occur. It is proposed that oxygen depletion of the surface oxide layer, caused by ion bombardment, is
a Magnetic and Mössbauer effect studies of ZnO thin film implanted with iron ions to high fluence ions to
a fluence of 1.5•1017 ion/cm2. As-implanted and post-annealed sample shows ferromagnetic
Analysis of Surface Morphology and Chemical Composition of Silicon Implanted with Copper Ions of 40 keV and doses in
a range of 3.1 × 1015–1.25 × 1017 ions/cm2 for
a current density of 8 μ
A/cm2
Formation of Cu nanoparticles and Cu3Si phase in Si by ion implantation+ ions at energy 40 keV, current density 8 μ
A/cm2 and doses of 3.1·1016 and 1.25·1017 ion/cm2