Spectral ellipsometry of cobalt-ions implanted silicon surface ions with energy of 40 ke
V at a fluence range from 6.6×1012 to 2.5×1017 Co+-ion/cm2 were investigated
Spectral ellipsometry of cobalt-ions implanted silicon surface ions with energy of 40 ke
V at a fluence range from 6.6×1012 to 2.5×1017 Co+-ion/cm2 were investigated
Optical properties of ZnO and Al2O3 implanted with silver ionsZnO and Al2O3 samples implanted with 30-ke
V silver ions with fluences in the interval (0