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BLOOD MICROCIRCULATION IN THE SKIN OF THE LIMBS IN CHILDREN OF 6-7 YEARS OLD ACCORDING TO THE LASER DOPPLER FLOWMETRY
Gurova O.A., Sakharov V.N., Kozlov V.I., Sidorov V.V.
NUMERICAL SIMULATION OF FLUCTUATIONS RELAXATION IN THE HYDRODYNAMIC MODEL OF QUANTUM-THERMAL DIFFUSION
Golubjeva O.N., Sidorov S.V.
Magnetic properties of dilute Al-REM alloys in liquid and amorphous states
Sidorov, V., Bykov, V., Uporov, S., Shevchenko, V., Kononenko, V., Shunyaev, K., Ilinykh, N., Svec, P., Janickovic, D.
The QCD analysis of xF3 structure function based on the analytic approach
Sidorov, A. V., Solovtsova, O. P.
Structure of sporadic meteor radiant distributions from radar observations
Belkovich O., Filimonova T., Sidorov V.
Asymptotics of the contour of the stationary phase and efficient evaluation of the Mellin-Barnes integral for the F3 structure function
Sidorov, A. V., Lashkevich, V. I., Solovtsova, O. P.
small number of terms N in quadrature formulas used to calculate integrals along these contours
Numerical simulation of relaxation of quantum thermal fluctuations
Golubjeva O.N., Sidorov S.V., Bar’Yakhtar V.G.
fluctuations. © O.N. GOLUBJEVA, S.V. SIDOROV, V.G. BAR’YAKHTAR, 2015.
Physical properties of some Sn-based melts
Sidorov, V., Uporov, S., Rozitsina, E., Yagodin, D., Grushevskij, K., Ilinykh, N.
Electrical properties of optimized nBn structures based on HgCdTe grown by molecular beam epitaxy
Izhnin, Igor I., Voytsekhovskiy, Alexander V., Nesmelov, Sergey N., Dzyadukh, Stanislav M., Dvoretsky, Sergei A., Mikhailov, Nikolay N., Sidorov, Georgiy Yu., Yakushev, Maxim V.
of MBE HgCdTe nBn structures. This paper presents the results of electrical characterization of n
The effect of As+ Ion implantation and annealing on the electrical properties of near-surface layers in graded-gap n-Hg0.78Cd0.22Te films
Voytsekhovskiy, Alexander V., Nesmelov, Sergey N., Dzyadukh, Stanislav M., Varavin, Vasilii S., Dvoretsky, Sergei A., Mikhailov, Nikolay N., Sidorov, Georgiy Yu., Yakushev, Maxim V., Marin, Denis V.
-surface layers in graded-gap n-Hg0.78Cd0.22Te films

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