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Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions
Bazarov V., Nuzhdin V., Valeev V., Vorobev V., Osin Y., Stepanov A.
by spectral ellipsometry and electron backscatter diffraction. Implantation was done with an ion energy of 30
Spectral ellipsometry of cobalt-ions implanted silicon surface
Bazarov V., Valeev V., Nuzhdin V., Osin Y., Gumarov G., Stepanov A.
by optical spectroscopic ellipsometry. By comparison of experimental data with modeling it is shown
Spectral ellipsometry of cobalt-ions implanted silicon surface
Bazarov V., Valeev V., Nuzhdin V., Osin Y., Gumarov G., Stepanov A.
by optical spectroscopic ellipsometry. By comparison of experimental data with modeling it is shown
Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions
Bazarov V., Nuzhdin V., Valeev V., Vorobev V., Osin Y., Stepanov A.
by spectral ellipsometry and electron backscatter diffraction. Implantation was done with an ion energy of 30
Spectral Ellipsometry as a Method of Investigation of Influence of Rapid Thermal Processing of Silicon Wafers on their Optical Characteristics
Solodukha, V. A., Pilipenko, U. A., Omelchenko, A. A., Shestovski, D. V.
and reticular density on their optical characteristics by means of the spectral ellipsometry method
Experimental and theoretical in situ spectral magneto-ellipsometry study oflayered ferromagnetic structures
Maximova, O. A., Lyaschenko, S. A., Vysotin, M. A., Tarasov, I. A., Yakovlev, I. A., Shevtsov, D. V., Fedorov, A. S., Varnakov, S. N., Ovchinnikov, S. G.
Experimental and theoretical in situ spectral magneto-ellipsometry study oflayered ferromagnetic
Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures
Maximova, O. A., Lyaschenko, S. A., Vysotin, M. A., Tarasov, I. A., Yakovlev, I. A., Shevtsov, D. V., Fedorov, A. S., Varnakov, S. N.
A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze
Multilayered Ferromagnetic Nanostructures Study: Processing Data From Magneto-ellipsometry Measurements
Максимова, О. А., Лященко, С. А., Варнаков, С. Н., Овчинников, С. Г.
Nowadays, the magneto-ellipsometry technique is considered as a promising tool for studying
Оптические характеристики отожженных пленок титаната бария, сформированных золь-гель методом
Стаськов, Н. И., Сотский, А. Б., Михеев, С. С., Гапоненко, Н. В., Холов, П. А., Райченок, Т. Ф., Staskov, N. I., Sotsky, A. B., Miheev, S. S., Gaponenko, N. V., Kholov, P. A., Raichenok, T. F.
аморфных материалов. Using the methods of spectral ellipsometry and spectrophotometry in the region
Экспериментальное и теоретическое исследование слоистых ферромагнитных структур методом спектральной in situ магнитоэллипсометрии/EXPERIMENTAL AND THEORETICAL IN SITU SPECTRAL MAGNETO-ELLIPSOMETRY STUDY OF LAYERED FERROMAGNETIC STRUCTURES
Максимова, О. А., Лященко, С. А., Высотин, М. А., Тарасов, И. А., Яковлев, И. А., Шевцов, Д. В., Федоров, А. С., Варнаков, С. Н., Овчинников, С. Г.
спектральной in situ магнитоэллипсометрии/EXPERIMENTAL AND THEORETICAL IN SITU SPECTRAL MAGNETO-ELLIPSOMETRY

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