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A new algorithm of restoring the autocorrelation function of subwavelength statistic surface roughness by light scattering in integrated optical waveguide in the presence of a high additive stochastic noiseA new algorithm of restoring the autocorrelation function of subwavelength statistic surface

Restoration of the autocorrelation function of a statistic surface roughness on the light scattering in a planar optical waveguide in the presence of the additive stochastic noiseRestoration of the autocorrelation function of a statistic surface roughness on the light

Optimization of characteristics and parameters of the waveguide optical microscopeAn algorithm of optimization of characteristics and parameters of a new type of optical microscope

Using of the waveguide light scattering for precision measurements of the statistic parameters of irregularities of integrated optical waveguide's materials

Investigation of the Process of Carbon Oxide's Dispersion from Motor Transport in Atmosphere

METHODS OF INVESTIGATION OF SUBMICRON OBJECTSA brief review of some methods of investigation of submicron objects is presented. The basic

A new algorithm of restoring the autocorrelation function of subwavelength statistic surface roughness by light scattering in integrated optical waveguide in the presence of a high additive stochastic noise) with 3D small statistical irregularities is considered. A new algorithm of definition of the correct

Restoration of the autocorrelation function of a statistic surface roughness on the light scattering in a planar optical waveguide in the presence of the additive stochastic noise the far zone 2D scattering diagram in the presence of additive stochastic noise was demonstrated. A

Inverse Laser Irradiation Scattering Problem in a Planar Waveguide with Statistical Irregularities. Computer Modeling for a Case of Large Additive "White" NoiseAn approximate correct solution of the inverse problem of light scattering in a planar waveguide

Reconstruction of characteristics and determination of parameters of statistical nanometer-scale surface roughness using the data on scattering in a planar optical waveguideWe consider the problem of scattering of a guided TE-mode in a planar optical waveguide with small

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