Дифференциальный метод анализа аналоговой схемотехники circuit derivations of
analog
devices, provided as generalized equivalent
circuits An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy with emphasis on OBIST strategy for
analog integrated
circuits. The design procedures according to DFT flow
Automated simulation of faults in analog circuits based on parallel paradigm test. The number of potential faults in
analog circuits is tremendous and the fault simulation requires
An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy with emphasis on OBIST strategy for
analog integrated
circuits. The design procedures according to DFT flow
On the Construction of Neuromorphic Fault Dictionaries for Analog Integrated Circuits to construct neuromorphic fault dictionaries that provide the fault diagnostics of
analog and mixed
Analogue integrated circuits design-for-testability flow oriented onto OBIST strategy for
analog integrated
circuits (IC). The design procedures according to DFT flow are proposed. Three possible