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Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions by spectral ellipsometry and electron backscatter diffraction. Implantation was done with an ion energy of 30
Measuring coherent peaks of polarization bremsstrahlung from relativistic electrons in polycrystalline targets in backscattering geometry orientations of the target relative to the electron beam. It is shown that the PB backscattering is sensitive
Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions by spectral ellipsometry and electron backscatter diffraction. Implantation was done with an ion energy of 30
On double polarization asymmetries in the elastic electron-proton scattering of the longitudinally polarized electrons by polarized proton target is considered with account of anapole G1p
Defects in α-Fe induced by intense-pulsed ion beam (IPIB)Using Rutherford back-scattering (RBS), secondary ion mass spectrometry (SIMS), Auger-electron
Suppression of abnormal grain growth in friction-stir welded Al-Cu-Mg alloy by lowering of welding temperatureelectron backscatter diffraction
On the relationship between microstructure and residual stress in laser-shock-peened Ti-6Al-4Velectron backscatter diffraction
Influence of the weld thermal cycle on the grain structure of friction-stir joined 6061 aluminum alloy/s, and the evolved microstructures were systematically examined using electron backscatter diffraction (EBSD). In all
EBSD study of superplasticity: New insight into a well-known phenomenonElectron backscatter diffraction (EBSD) was applied to investigate the superplastic behavior of a
Microstructural characterization of friction-stir processed Ti-6Al-4V during FSP of Ti-6Al-4V. To this end, the electron backscatter di raction (EBSD) technique was employed
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