Creation of lithographic masks using a scanning probe microscope)—the formation of lithographic masks using
scanning probe
microscope—are presented. Polymethylmethacrylate (PMMA
New method of surface analysis using spin-polarized electrons-polarized
electron beams. Examples are provided to show the application of the new techniques based on spin
Microscopic Examination of the Silicon Surface Subjected to High-Dose Silver Implantation of implanted wafers has been examined using
scanning electron microscopy, transmission
electron microscopy
The effect of femtosecond laser treatment on the tribological properties of titanium nitride nitride (TiN) coatings have been studied. It has been revealed using
scanning electron microscopy
The microstructure study of CJP products electron microscope were used to analyze the structure. Analysis of IR spectra showed that when the gluing
Применение сканирующей электронной микроскопиив решении актуальных проблем материаловеденияЗеер, Г.М.,
Фоменко, О.Ю.,
Ледяева, О.Н.,
Zeer, Galina M.,
Fomenko, Oksana Yu.,
Ledyaeva, Olga N. materials were considered. Capabilities of JSM 7001F
scanning electron microscope of JEOL Company with a set
Thermal-chemical characteristics of Al-Cu alloy nanoparticles calorimeter (DSC) method. The microstructure of the particles was characterized with a
scanning electron