Nanoscale mobility mapping in semiconducting polymer films by nanoscale
structure, vary more than two times in value and have a root-mean-square value 0.22 × 10−8 m2/(Vs
Fingerprint Raman spectroscopy for two-dimensional MoS2xSe2(1−x) alloys structure Se atoms are substituted by S atoms, the in-plane E12g (S-Mo), E12g (Se-Mo) and out-plane A1ʹ (S
Electrophysical characteristics of Sub-THz diode with Schottky barrier of
semiconductor structure with a Schottky barrier based on n- GaAs are presented. Current-voltage characteristic
Воздействие разрядов статического электричества на полупроводниковые структуры и интегральные схемы электростатических разрядов.
The features of diagnostic methods for assessing the stability of the
semiconductor Анализ технологии плазменной обработки полупроводниковых структурAnalysis of the plasma processing technology of
semiconductor structures