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Modeling of Vacuum Circuit Breaker Deterioration ProcessModeling of Vacuum Circuit Breaker Deterioration Process

Applying incompletely specified Boolean functions for patch circuit generationWe consider combination circuit C and some its nodes that faults are detected on the last stages

Masking internal node logical faults and trojan circuits injections with using SAT solversWe consider a combination circuit (the combinational part of a sequential circuit) and some nodes

Trojan Circuits masking and debugging of combinational circuits with LUT insertionIt is extremely difficult to provide 100% correctness of fabricated high performance circuits

Current conveyors in current-mode circuits approximating fractional-order low-pass filterUsing current conveyors, we present six different current-mode circuits approximating fractional

Masking circuit faults and Trojan circuit injections using sat solversCombinational circuit C composed of gates and its sub-circuit with set V of output nodes and set U

Searching for Optmal Synchronizing Sequences for Testng Logic CircuitsSearching for Optmal Synchronizing Sequences for Testng Logic Circuits

Method of measurement of electromagnetic radiation from printed circuit board in the near field by spectral-polarization method a printed circuit board in the near field on the basis of the simplest oscillators- Hertz dipoles

Analogue integrated circuits design-for-testability flow oriented onto OBIST strategy
frequency generated at the output of the circuit after reconfiguring into oscillator as a controlled

An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy with emphasis on OBIST strategy for analog integrated circuits. The design procedures according to DFT flow

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