Modeling of Vacuum Circuit Breaker Deterioration ProcessModeling of Vacuum
Circuit Breaker Deterioration Process
Applying incompletely specified Boolean functions for patch circuit generationWe consider combination
circuit C and some its nodes that faults are detected on the last stages
Masking internal node logical faults and trojan circuits injections with using SAT solversWe consider a combination
circuit (the combinational part of a sequential
circuit) and some nodes
Trojan Circuits masking and debugging of combinational circuits with LUT insertionIt is extremely difficult to provide 100% correctness of fabricated high performance
circuits Current conveyors in current-mode circuits approximating fractional-order low-pass filterUsing current conveyors, we present six different current-mode
circuits approximating fractional
Masking circuit faults and Trojan circuit injections using sat solversCombinational
circuit C composed of gates and its sub-
circuit with set V of output nodes and set U
Searching for Optmal Synchronizing Sequences for Testng Logic CircuitsSearching for Optmal Synchronizing Sequences for Testng Logic
Circuits Analogue integrated circuits design-for-testability flow oriented onto OBIST strategy frequency generated at the output of the
circuit after reconfiguring into oscillator as a controlled
An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy with emphasis on OBIST strategy for analog integrated
circuits. The design procedures according to DFT flow