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The analysis of the cuticle of hair from the population of the USSR and some Asian countries by scanning electron microscopy
Alisievich V.I., Eremina E.I., Pavlov Yu.V.
by scanning electron microscopy
Potential of CLSM in studying some modern and fossil palynological objects
Gavrilova O., Zavialova N., Tekleva M., Karasev E.
), or transmission electron microscopy. The resolution of confocal microscope is much lower than that of electron
Electron microscopic examination of ultrastructure of Leptospirae and formation of their agglutinates (Russian)
Kiktenko V.S., Bakulina N.A., Levina L.F.
Electron microscopic examination of ultrastructure of Leptospirae and formation
Potential of CLSM in studying some modern and fossil palynological objects
Gavrilova O., Zavialova N., Tekleva M., Karasev E.
), or transmission electron microscopy. The resolution of confocal microscope is much lower than that of electron
DNA mapping in the capsid of giant bacteriophage phiEL (Caudovirales: Myoviridae: Elvirus) by analytical electron microscopy [Картирование ДНК в капсиде гигантского бактериофага phiEL (Caudovirales: Myoviridae: Elvirus) с помощью аналитической электронной микроскопии]
Trifonova T.S., Moiseenko A.V., Bourkaltseva M.V., Shaburova O.V., Shaytan A.K., Krylov V.N., Sokolova O.S.
, an inner body (IB) with supercoiled DNA molecule wrapped around it. Standard cryo-electron microscopy (cryo
Primary Characterization of SARS Coronavirus Strain Frankfurt 1
Agafonov A.P.
electron microscopy
Visual appearance of demodex mites and their localization in the pilosebaceous complexes
Pustovaya K.N., Avanesova N.I., Zhuk I., Smorchkov M.M., Nozdrin V.I.
by scanning electron and light microscopy. Material and methods. Visual appearance of Demodex mites imago were
New method of surface analysis using spin-polarized electrons
Tishchenko A.A., Sheka E.F.
-polarized electron beams. Examples are provided to show the application of the new techniques based on spin
Ceramic technology. How to investigate surface finishing
Ionescu C., Hoeck V.
analytical methods, such as macroscopy, optical microscopy, electron microprobe, scanning electron microscopy
Defects in α-Fe induced by intense-pulsed ion beam (IPIB)
Valyaev A.N., Ladysev V.S., Mendygaliev D.R., Pogrebnjak A.D., Valyaev A.A., Pogrebnjak N.A.
spectroscopy (AES), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) techniques

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