Error modeling in semiconductor memory of computersDefects in semiconductor memory chips and
errors of their functioning are of interest to both
Method for generating two-dimensional dependent errorsThe method of forming patterns of dependent two-dimensional
errors is considered. It is shown
ERROR ANALYSIS IN THE PROCESS OF INTERPRETATION TRAININGThe article deals with
error analysis, one of the most essential components in the process
Errors in the preparation and presentation of accounting (financial) statementsThe main problems and
errors in the preparation of accounting (financial) statements.
Improving the Accuracy of Exponentially Converging Quadratures asymptotically accurate estimates of the
error of such quadratures are obtained. They take into account
A fast feature error pattern generating two-dimensional error patternsIn this paper, after comprehensive analysing the existing method for forming feature
error pattern
Error-free affine, unitary, and probabilistic OBDDS and show that zero-
error affine OBDDs can be exponentially narrower than bounded-
error unitary