Searching for Optmal Synchronizing Sequences for Testng Logic CircuitsThe problem under consideration is to find a
synchronizing sequence for a
logic network with memory
Masking internal node logical faults and trojan circuits injections with using SAT solversWe consider a combination
circuit (the combinational part of a sequential
circuit) and some nodes
Trojan Circuits masking and debugging of combinational circuits with LUT insertion. Manufactured
circuits may have
logical and electrical bugs, Trojan
Circuits (TCs) inclusions and so on
Signature analysis of circuits with detection of single faults of built-in
testing of combinational
circuits is suggested that uses a linear sequential machine
Signature analysis of circuits with detection of single faults of built-in
testing of combinational
circuits is suggested that uses a linear sequential machine
Исследование влияния радиопомех на динамические параметры логических элементов parameters of
logic elements is investigated. During the
tests, the
logic inverters were connected according