Admittance of MIS-structures based on HgCdTe with a double-layer CdTe/Al2O3 insulator
Voytsekhovskiy, Alexander V.,
Nesmelov, Sergey N.,
Sidorov, Georgiy Yu.,
Varavin, Vasilii S.,
Vasilev, Vladimir V.,
Dvoretsky, Sergei A.,
Mikhailov, Nikolay N.,
Yakushev, Maxim V.,
Dzyadukh, Stanislav M.
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