Estimation of the impact of semiconductor device parameters on the accuracy of separating a mixed production batch of
semiconductor devices for the space industry into homogeneous production batches. The method of factor analysis
Self-powered photo diodes based on Ga2O3/n-GaAs structuresKalygina, Vera M.,
Kiselyeva, O. S.,
Kushnarev, Bogdan O.,
Oleinik, Vladimir L.,
Petrova, Julianna S.,
Tsymbalov, Alexander V. characteristic of metal-insulator-
semiconductor structures and exhibit low sensitivity to radiation with λ=254 nm
Berry Phase in single crystals of the dilute magnetic semiconductor (Cd₀.₇Zn₀.₂₈Mn₀.₀₂)₃As₂ magnetic
semiconductor (Cd₀.₇Zn₀.₂₈Mn₀.₀₂)₃As₂ (CZMA). Based on analysis of the Shubnikov-de Haas (Sd
Positron annihilation induced Auger electron spectroscopic studies of reconstructed semiconductor surfaces to chemical composition and atomic
structure of the topmost layers of the surface. Theoretical annihilation
Study of the photovoltage in Mn/SiO2/n-Si MOS structure at cryogenic temperaturesBondarev, I. A.,
Rautskii, M. V.,
Yakovlev, I. A.,
Volochaev, M. N.,
Lukyanenko, A. V.,
Tarasov, A. S.,
Volkov, N. V. Study of the photovoltage in Mn/SiO2/n-Si MOS
structure at cryogenic temperatures