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Measuring Dental Enamel Thickness: Morphological and Functional Relevance of Topographic Mapping
Gaboutchian A.V., Knyaz V.A., Maschenko E.N., Dac L.X., Maksimov A.A., Emelyanov A.V., Korost D.V., Stepanov N.V.
the metric data and dental morphology and provide the possibility for objective and replicable studies
О 3-транзитивности группы преобразований плоскости Лобачевского в модели Бельтрами-Клейна
Нигматуллина Лейсан Ильшатовна
metric
Расширение значения термина «документ» как фактор возможного переосмысления объектов библиометрии, наукометрии и информетрии. 2. Старые определения объектов «метрий» в контексте нового определения термина «документ»
Лазарев, В. С.
of Bibliometrics, Scientometrics, and Informetrics. 2. Old Definitions of the Objects of “Metrices” in the Context
Rigidity Conditions for the Boundaries of Submanifolds in a Riemannian Manifold
Kopylov, Anatoly P., Korobkov, Mikhail V., Копылов, Анатолий П., Коробков, Михаил В.
- dimensional Riemannian manifold (X; g) without boundary. Let us consider the intrinsic metric (the infimum
VAIC: New Financial Performance Metric and Valuation Tool
Ибрагимов Р. Г.
VAIC: New Financial Performance Metric and Valuation Tool
String metric defined by the splicing operations
Сверчков С. Р.
String metric defined by the splicing operations
On Gravitational Nonmetricity Plane Waves in an Affine-Metric Space
Baburova O.V., Markova N.V., Frolov B.N., Khetseva M.S.
On Gravitational Nonmetricity Plane Waves in an Affine-Metric Space
Nonminimal black holes with regular electric field
Balakin A., Zayats A.
earlier in our works: the first of them describes a nonminimal spherically symmetric object (star or black
Fiberwise function contraction mapping principle
Pasynkova E.
For metric maps, continuous and retract sections consisting of fix points are obtained. This is a
A review of metric analysis applications to the problems of interpolating, filtering and predicting the values of onevariable and multivariable functions
Kryanev A.V., Ivanov V.V., Sevastianov L.A., Udumyan D.K.
At present, metric analysis schemes are developed to solve the problems of interpolation, smoothing

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