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Testing microcontroller based physical systems using finite transition models

Testing digital circuits: studying the increment of the number of states and estimating the fault coverage

Assessing trustworthiness of IoT applications using logic circuits

Optimizing components of finite state machines composition based on don’t care input sequences in hardware implementation

On the fault coverage of high-level test derivation methods for digital circuits

Electronic topological transition in InSe thin films

Heterocycle-guided synthesis of m-hetarylanilines via three-component benzannulation

Model of broadband metamaterial for microwaves

Translocation as the method of negative impact decrease on lichenobiota

Study of atomic and electronic structure of Si(100) ‪2*2-(Au/TI) surface reconstruction

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