Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2Detecting a
Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN
2 Extension of the hierarchy for k-OBDDs of small width method allows us to extend the
hierarchy proved by Bolling-Sauerhoff-Sieling-Wegener in 1996 for k
Recommendations for making personnel decisions in public and large private companiesThe development of the concept of mutual perception of persons holding positions in the
hierarchy