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EPR, ENDOR, and optical spectroscopy of the tetragonal Yb3+ center in KMgF3

Falin M., Latypov V., Kazakov B., Leushin A., Bill H., Lovy D.

of the transferred hyperfine interaction (THFI) parameters is presented. It is further shown from optics and from

XSS J00564+4548 and IGR J00234+6141: New cataclysmic variables from the RXTE and INTEGRAL all-sky surveys

Bikmaev I., Revnivtsev M., Burenin R., Sunyaev R.

We present the results of our optical identification of two X-ray sources from the RXTE

The effect of uncorrelatedness of inhomogeneous broadening on the formation of transient optical processes in multilevel systems

Nefed'ev L., Nizamova E., Taktaeva S.

of the stimulated photon echo depend on the parameter of the random interaction of an optical electron with a local

Optical Spectroscopy of Octahedral Impurity Yb3+ Ions in a CsCaF3 Crystal

Leushin A., Kazakov B., Safiullin G.

Optical spectra of a CsCaF3 crystal doped with Yb3+ ions are experimentally separated into groups

A Technique for investigating the effects of planetary waves on aerosol optical thickness variations

waves based on aerosol optical thickness (AOT) observations at spatially separated stations

Optical properties of dielectric plates coated with gapped graphene

Klimchitskaya G., Mostepanenko V.

© 2017 American Physical Society.The optical properties of dielectric plates coated with gapped

High-resolution magneto-optical spectroscopy of LiYF4 7: Er 3+ 167, Er 3+ 166 and analysis of hyperfine structure of ultranarrow optical transitions

Gerasimov K., Minnegaliev M., Malkin B., Baibekov E., Moiseev S.

© 2016 American Physical Society.We performed high-resolution magneto-optical spectroscopy

High-resolution magneto-optical spectroscopy of LiYF4 7: Er 3+ 167, Er 3+ 166 and analysis of hyperfine structure of ultranarrow optical transitions

Gerasimov K., Minnegaliev M., Malkin B., Baibekov E., Moiseev S.

© 2016 American Physical Society.We performed high-resolution magneto-optical spectroscopy

Methodology for Solving High-dimensional Multi-Parameter Inverse Problems of Indirect Measurements

Dolenko, S., Isaev, I., Burikov, S., Dolenko, T., Obornev, E., Shimelevich, M.

Methodology for Solving High-dimensional Multi-Parameter Inverse Problems of Indirect Measurements

Reconstruction of characteristics and determination of parameters of statistical nanometer-scale surface roughness using the data on scattering in a planar optical waveguide

We consider the problem of scattering of a guided TE-mode in a planar optical waveguide with small

Страница 10 из 2976