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Determining the divergence of an ultra-relativistic electron beam from the diffracted transition radiation in a single-crystal target
Blazhevich, S. V., Bronnikova, M. V., Noskov, A. V.
We have studied the possibilities of using diffracted transition radiation excited by a
Diffracted transitive radiation as a means for indicating the divergence of an ultrarelativistic electron beam
Blazhevich, S. V., Bronnikova, M. V., Noskov, A. V.
Results of model calculations of the electron beam divergence parameters for a given yield of DTR
On the problem of application of diffracted transition radiation for indication of relativistic electron beam parameters
Blazhevich, S., Bronnikova, M., Lyushina, K., Noskov, A., Zagorodnyuk, R.
The model calculations of the electron beam divergence parameters on the base of “measured” yield
Diffracted transition radiation of a beam of relativistic electrons in a thin single-crystal plate
Blazhevich, S. V., Ligidov, A. Z., Mazilov, A. A., Nemtsev, S. N., Noskov, A. V.
In the present work, diffracted transition radiation (DTR) of the beam of relativistic electrons
Effect of the divergence of a relativistic electron beam on the diffracted transition radiation excited by them in a single-crystal target
Blazhevich, S. V., Bronnikova, M. V., Noskov, A. V.
The dependence of the angular density and the photon yield of collimated diffracted transition
Dynamical diffraction effects in the transition radiation of a relativistic electron crossing a thin crystal
Imanishi, N., Nasonov, N., Yajima, K.
Transition radiation (TR) of a relativistic electron crossing the in surface of a crystal may
Laser beam modulation using corner reflector and deep diffraction grating
Komotskii V.A., Sokolov Y.M., Suetin N.V.
diffraction grating that is placed on a plane of the unit and has a relief depth of several wavelengths
Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions
Bazarov V., Nuzhdin V., Valeev V., Vorobev V., Osin Y., Stepanov A.
by spectral ellipsometry and electron backscatter diffraction. Implantation was done with an ion energy of 30
Influence of real photon diffraction contribution on parametric X-ray observed characteristics
Laktionova, S. A., Pligina, O. O, Sidnin, M. A., Vnukov, I. E.
It is proposed and implemented a simple method of calculating of the output of the diffracted real
Influence of real photon diffraction on parametric X-ray radiation angular distribution in thin perfect crystals
Goponov, Yu. A., Laktionova, S. A., Pligina, O. O., Sidnin, M. A., Vnukov, I. E.
crystals. It is shown that for average energy of electrons and the center of the PXR spot diffracted real

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