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Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions
Bazarov V., Nuzhdin V., Valeev V., Vorobev V., Osin Y., Stepanov A.
by spectral ellipsometry and electron backscatter diffraction. Implantation was done with an ion energy of 30
RBS-channeling analysis of er D-doped LNP(001) crystal
Yahara, J., Morita, K., Fujiwara, Y., Takeda, Y.
was carried out by Rutherford backscattering spectromery with the channeling technique
Measuring coherent peaks of polarization bremsstrahlung from relativistic electrons in polycrystalline targets in backscattering geometry
Alekseev, V. I., Vokhmyanina, K. A., Zhukova, P. N., Eliseev, A. N., Kubankin, A. S., Nasonov, N. N.
in a polycrystalline copper target have been measured in the backscattering geometry for various
Analytical technologies for thin coating element material diagnostics with PXWR application
Egorov E.
element composition in the bulk and thin surface layer of studied objects. Rutherford backscattering
Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions
Bazarov V., Nuzhdin V., Valeev V., Vorobev V., Osin Y., Stepanov A.
by spectral ellipsometry and electron backscatter diffraction. Implantation was done with an ion energy of 30
Calibrating HF Radar Elevation Angle Measurements Using E Layer Backscatter Echoes
Ponomarenko P., St.-Maurice J.P., McWilliams K.A.
Calibrating HF Radar Elevation Angle Measurements Using E Layer Backscatter Echoes
Investigation of the Intercalation and Deintercalation of Lithium Ions in a Thin-Film Lithium-Ion Battery by Rutherford Backscattering Spectrometry
Kurbatov S.V., Melesov N.S., Parshin E.O., Rudy A.S., Mironenko A.A., Naumov V.V., Skundin A.M., Bachurin V.I.
-state thin-film lithium-ion battery using the Rutherford backscattering spectrometry (RBS) method
Multiple reflections in backscattering by a single scatterer near a perfectly reflecting surface
Ismagilova F., Ismagilov F.
. As a result, the backscattering enhancement effect becomes stronger, and the angle of incidence
Interference phenomena at backscattering by ice crystals of cirrus clouds
Borovoi, Anatoli G., Kustova, Natalia V., Konoshonkin, Alexander V.
It is shown that light backscattering by hexagonal ice crystals of cirrus clouds is formed within
Interference phenomena at backscattering by ice crystals of irregular shape
Konoshonkin, Alexander V., Kustova, Natalia V., Borovoi, Anatoli G.
It is shown that light backscattering by hexagonal ice crystals of cirrus clouds is formed by both

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