Low-temperature transport of charge carriers in InGaN/GaN multiple quantum well light-emitting diodesGaN/GaN multiple quantum well light-emitting diodes are presented.
A new model for explaining the complex current
Luminescence of Ga2O3 crystals excited with a runaway electron beamBurachenko, Alexander G.,
Prudaev, Ilya A.,
Sorokin, Dmitry A.,
Tarasenko, Viktor Fedotovich,
Tolbanov, Oleg P.,
Beloplotov, Dmitry V. crystals excited with
a runaway electron beam and an excilamp with
a wavelength of 222 nm were investigated
Electron irradiation degradation of AlGaInP/GaAs light‐emitting diodes. The beneficial effect of the Mg doping of the p‐GaP(Mg) window layer on the LEDs radiation tolerance at
a high
Charge carrier transport and deep levels recharge in avalanche s-diodes based on GaAs been studied. It has been found by solving the continuity and Poisson equations with the use of
a Properties of gallium oxide films obtained by HF-magnetron sputteringKalygina, V. M.,
Novikov, Vadim A.,
Prudaev, Ilya A.,
Tolbanov, Oleg P.,
Tyazhev, Anton V.,
Lygdenova, T. Z. with increasing temperature is due to the excitation of electrons from
a local level Е t located 0.95 eV below
Deep centers in TiO2-Si structures sputtering of
a titanium-oxide target onto unheated n-Si substrates. The forward and reverse currents
Formation of dislocations in the process of impurity diffusion in GaAsA study of the formation of dislocations in the process of impurity diffusion in GaAs has been